Title :
Edge Diffraction Suppression in Rectangular Dielectric Resonators for Quality Factor Enhancement Using Artificial Plasma
Author :
Parsa, Armin ; Paknys, Robert ; Caloz, Christophe
Author_Institution :
Dept. of Electr. Eng., Ecole Polytech. de Montreal, Montreal, QC
fDate :
5/1/2009 12:00:00 AM
Abstract :
The concept of quality factor enhancement in a two dimensional rectangular dielectric resonator (RDR), based on the phenomenon of edge diffraction suppression by a plasma, is presented. This phenomenon occurs when the plasma exhibits the specific negative permittivity, which makes the RDR separable, i.e., analytically solvable by means of the separation of variables. The Rotman plasma, constituted of metal thin wires is proposed as a practical implementation of this ideal plasma, and the diffraction suppression concept is demonstrated with this plasma by an SIE/MoM approach verified by using a finite element method solver, HFSS. It is shown that a relatively small number of wires (4 times 4) in the plasma is sufficient to mimic a close-to-ideal plasma medium, which suggests a potential for practical applications. This study reveals that the utilization of this plasma allows a strong (high-Q) resonance even for low-permittivity dielectrics otherwise improper to act as resonators.
Keywords :
Q-factor; dielectric resonators; metallic thin films; method of moments; permittivity; MoM; Rotman plasma; SIE; artificial plasma; edge diffraction suppression; finite element method solver; negative permittivity; quality factor enhancement; rectangular dielectric resonators; separation of variables; Dielectrics; Electromagnetic diffraction; Permittivity; Plasma applications; Plasma density; Plasma devices; Plasma materials processing; Q factor; Resonance; Wires; Artificial plasma; dielectric resonator (DR); method of moments (MoM); rectangular DR (RDR); surface integral equation (SIE);
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2009.2016783