• DocumentCode
    814780
  • Title

    Design and simulation of a single-electron random-access memory array

  • Author

    Karafyllidis, Ioannis

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
  • Volume
    49
  • Issue
    9
  • fYear
    2002
  • Firstpage
    1370
  • Lastpage
    1375
  • Abstract
    A single-electron random-access memory array is designed and its operation is analyzed using Monte Carlo simulation. This memory array utilizes a basic single-electron memory cell that has been recently fabricated. Bits of information are represented by the presence or absence of a single or a small number of electrons at conducting islands. Simulation shows that selective read and write operations can be performed in this memory array.
  • Keywords
    Coulomb blockade; Monte Carlo methods; cellular arrays; electron traps; integrated memory circuits; quantum interference devices; random-access storage; resonant tunnelling; Monte Carlo simulation; conducting islands; electron trap memory cell; random-access memory array; selective read operations; selective write operations; single-electron RAM array; single-electron memory cell; Application software; CMOS technology; Circuit simulation; Computational modeling; Computer simulation; Electron traps; Inverters; Power dissipation; Read-write memory; Single electron memory;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/TCSI.2002.802385
  • Filename
    1031973