DocumentCode
814780
Title
Design and simulation of a single-electron random-access memory array
Author
Karafyllidis, Ioannis
Author_Institution
Dept. of Electr. & Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
Volume
49
Issue
9
fYear
2002
Firstpage
1370
Lastpage
1375
Abstract
A single-electron random-access memory array is designed and its operation is analyzed using Monte Carlo simulation. This memory array utilizes a basic single-electron memory cell that has been recently fabricated. Bits of information are represented by the presence or absence of a single or a small number of electrons at conducting islands. Simulation shows that selective read and write operations can be performed in this memory array.
Keywords
Coulomb blockade; Monte Carlo methods; cellular arrays; electron traps; integrated memory circuits; quantum interference devices; random-access storage; resonant tunnelling; Monte Carlo simulation; conducting islands; electron trap memory cell; random-access memory array; selective read operations; selective write operations; single-electron RAM array; single-electron memory cell; Application software; CMOS technology; Circuit simulation; Computational modeling; Computer simulation; Electron traps; Inverters; Power dissipation; Read-write memory; Single electron memory;
fLanguage
English
Journal_Title
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher
ieee
ISSN
1057-7122
Type
jour
DOI
10.1109/TCSI.2002.802385
Filename
1031973
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