DocumentCode
815045
Title
Realizations of IIR/FIR and N -path filters using a novel switched-capacitor technique
Author
Yu, Tsai-Chung ; Wu, Chung-Yu ; Chang, Shin-Chi
Author_Institution
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsin-Chu, Taiwan
Volume
37
Issue
10
fYear
1990
fDate
10/1/1990 12:00:00 AM
Firstpage
1231
Lastpage
1247
Abstract
Two canonical and two ladder structures are proposed for the realization of infinite impulse response (IIR) transfer functions using switched-capacitor (SC) differentiators and the synthetic division technique. The resultant filter structures are simple, compact, and stray insensitive. They have a low component sensitivity, good low-frequency noise performance, and adequate dynamic range. Theoretical calculation and SWITCAP simulation results on certain types of filters show good consistency with the experimental results, substantiating both design methodology and circuit functions. Circuit examples are given and their functions are successfully verified through chip fabrication and measurement. The multiplexed SC differentiators are modified to form three types of N -path circuits which can be used to design a narrowband bandpass filter. Because the N -path circuits are based upon SC differentiators rather than SC integrators, they have distinct performance superior to that of SC integrator-based N -path circuits
Keywords
MOS integrated circuits; active filters; band-pass filters; differentiating circuits; ladder networks; switched capacitor filters; FIR filters; IIR filters; MOSIC; N-path filters; SWITCAP simulation; canonical structures; design methodology; infinite impulse response; ladder structures; low component sensitivity; low-frequency noise performance; multiplexed SC differentiators; narrowband bandpass filter; stray insensitive; switched-capacitor technique; synthetic division technique; transfer functions; Chip scale packaging; Circuit simulation; Design methodology; Dynamic range; Finite impulse response filter; IIR filters; Integrated circuit measurements; Low-frequency noise; Semiconductor device measurement; Transfer functions;
fLanguage
English
Journal_Title
Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0098-4094
Type
jour
DOI
10.1109/31.103218
Filename
103218
Link To Document