DocumentCode :
815045
Title :
Realizations of IIR/FIR and N-path filters using a novel switched-capacitor technique
Author :
Yu, Tsai-Chung ; Wu, Chung-Yu ; Chang, Shin-Chi
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsin-Chu, Taiwan
Volume :
37
Issue :
10
fYear :
1990
fDate :
10/1/1990 12:00:00 AM
Firstpage :
1231
Lastpage :
1247
Abstract :
Two canonical and two ladder structures are proposed for the realization of infinite impulse response (IIR) transfer functions using switched-capacitor (SC) differentiators and the synthetic division technique. The resultant filter structures are simple, compact, and stray insensitive. They have a low component sensitivity, good low-frequency noise performance, and adequate dynamic range. Theoretical calculation and SWITCAP simulation results on certain types of filters show good consistency with the experimental results, substantiating both design methodology and circuit functions. Circuit examples are given and their functions are successfully verified through chip fabrication and measurement. The multiplexed SC differentiators are modified to form three types of N-path circuits which can be used to design a narrowband bandpass filter. Because the N-path circuits are based upon SC differentiators rather than SC integrators, they have distinct performance superior to that of SC integrator-based N-path circuits
Keywords :
MOS integrated circuits; active filters; band-pass filters; differentiating circuits; ladder networks; switched capacitor filters; FIR filters; IIR filters; MOSIC; N-path filters; SWITCAP simulation; canonical structures; design methodology; infinite impulse response; ladder structures; low component sensitivity; low-frequency noise performance; multiplexed SC differentiators; narrowband bandpass filter; stray insensitive; switched-capacitor technique; synthetic division technique; transfer functions; Chip scale packaging; Circuit simulation; Design methodology; Dynamic range; Finite impulse response filter; IIR filters; Integrated circuit measurements; Low-frequency noise; Semiconductor device measurement; Transfer functions;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/31.103218
Filename :
103218
Link To Document :
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