Efficient distributed algorithms for self testing of multiple processor systems

Author

Hosseini, Seyed H. ; Jamal, Nizar

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Wisconsin Univ., Milwaukee, WI, USA

Volume

41

Issue

11

fYear

1992

fDate

11/1/1992 12:00:00 AM

Firstpage

1397

Lastpage

1409

Abstract

Multiple processor systems allow both highly reliable and highly fast service. Distributed self-test algorithms that attempt to improve both the reliability and the performance of these systems are proposed. In these algorithms, reliability is improved by considering the distributed mode of control and assigning processors to test each other periodically for the diagnosis and isolation of the faulty processors and interprocessor links. Meanwhile, performance is improved by considering a dynamic testing strategy and minimizing testing overhead by reducing the number of tests performed on each processor. Simulation results show the effectiveness of the algorithms

Keywords

automatic testing; fault tolerant computing; multiprocessing systems; performance evaluation; distributed algorithms; dynamic testing; interprocessor links; multiple processor systems; performance; reliability; self testing; simulation results; testing overhead; Automatic testing; Built-in self-test; Communication channels; Distributed algorithms; Distributed computing; Distributed control; Fault diagnosis; Performance evaluation; Process control; System testing;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/12.177310

Filename

177310