DocumentCode :
815444
Title :
Scanning micromirrors fabricated by an SOI/SOI wafer-bonding process
Author :
Zhou, Lixia ; Kahn, Joseph M. ; Pister, Kristofer S J
Author_Institution :
Qualcomm MEMS Technol., San Jose, CA, USA
Volume :
15
Issue :
1
fYear :
2006
Firstpage :
24
Lastpage :
32
Abstract :
MEMS scanning micromirrors have been proposed to steer a modulated laser beam in order to establish secure optical links between rapidly moving platforms. An SOI/SOI wafer-bonding process has been developed to fabricate scanning micromirrors using lateral actuation. The process is an extension of established SOI technology and can be used to fabricate stacked high-aspect-ratio structures with well-controlled thicknesses. Fabricated one-axis micromirrors scan up to 21.8° optically under a dc actuation voltage of 75.0 V, and have a resonant frequency of 3.6 kHz. Fabricated two-axis micromirrors scan up to 15.9° optically on the inner axis at 71.8 V and 13.2° on the outer axis at 71.2 V. The micromirrors are observed to be quite durable and resistant to shocks. Torsional beams with T-shaped cross sections are introduced to replace rectangular torsional beams in two-axis MEMS micromirrors, in order to reduce the cross-coupling between the two axial rotations. Fabricated bidirectional two-axis micromirrors scan up to ±7° on the outer-axis and from -3° to 7° on the inner-axis under dc actuation.
Keywords :
beam steering; micromechanical devices; micromirrors; silicon-on-insulator; wafer bonding; 3.6 kHz; 71.2 V; 71.8 V; 75 V; MEMS micromirrors; SOI/SOI wafer-bonding; electrostatic actuation; high-aspect-ratio structures; lateral actuation; modulated laser beam; optical links; scanning micromirrors; silicon on insulator technology; torsional beams; Electric shock; High speed optical techniques; Laser beams; Micromechanical devices; Micromirrors; Mirrors; Optical fiber communication; Optical modulation; Silicon on insulator technology; Vertical cavity surface emitting lasers; Electrostatic actuation; MEMS; micromirror; silicon on insulator technology; wafer bonding;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2005.863736
Filename :
1588905
Link To Document :
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