DocumentCode :
815558
Title :
A new technique for measuring the constitutive parameters of planar materials
Author :
Scott, Waymond R., Jr.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
41
Issue :
5
fYear :
1992
fDate :
10/1/1992 12:00:00 AM
Firstpage :
639
Lastpage :
645
Abstract :
A technique for measuring the constitutive parameters of materials over a broad range of frequencies is developed. The technique is specifically designed for planar samples. Planar samples can be placed in the measurement fixture without any special preparation; this makes the technique more convenient than other techniques which require that the sample has to be machined to fit into a measurement fixture. Using fourth-order elements, the finite-element method provides a general, very accurate solution. The technique is experimentally verified by measuring the constitutive parameters of two materials with known properties. The measured results are compared to those of other investigators and are shown to be in good agreement
Keywords :
finite element analysis; permittivity measurement; Al2O3; Teflon; alumina; complex permeability; complex permittivity measurement; constitutive parameters; finite-element method; fourth-order elements; organic compounds; planar materials; Coaxial components; Conducting materials; Finite element methods; Fixtures; Frequency measurement; Permeability measurement; Permittivity measurement; Reflection; TV; Transmission line measurements;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.177335
Filename :
177335
Link To Document :
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