Title :
An integrated PC-based system for measurement of various parameters for two-terminal devices used in the industry
Author :
Upadhye, Milind ; Sathe, A.P.
Author_Institution :
Victor Co. of Japan, Ibarani, Japan
fDate :
10/1/1992 12:00:00 AM
Abstract :
A PC-based system has been designed to measure different parameters and carry out nondestructive accelerated tests for various two-terminal electronic devices used in the industry. This gives an inexpensive, fairly accurate testing method, without manual errors, for measurement, data entry, and analysis. The system software is user friendly for semi-skilled workers and also can be hooked up to a main computer or LAN for a total integration approach in the industry
Keywords :
electronic equipment testing; microcomputer applications; nondestructive testing; LAN; industry; integrated PC system; microcomputer; nondestructive accelerated tests; semi-skilled workers; total integration; two-terminal electronic devices; Computer errors; Data analysis; Electronic equipment testing; Electronics industry; Industrial electronics; Life estimation; Local area networks; Nondestructive testing; System software; System testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
