• DocumentCode
    815953
  • Title

    Prognosis for High-Z Semiconductor Detectors

  • Author

    Swierkowski, S.P. ; Armantrout, G.A.

  • Author_Institution
    Lawrence Livermore Laboratory, University of California Livermore, Califoria 94550
  • Volume
    22
  • Issue
    1
  • fYear
    1975
  • Firstpage
    205
  • Lastpage
    210
  • Abstract
    Considerable interest has been generated recently in the use of high-Z semiconductors for x-ray spectroscopy. To aid in this study, a Monte-Carlo computational model has been used to simulate x-ray spectral response in semiconductor detectors. The model employs one-dimensional charge collection in an arbitrary electric field profile and includes trapping and electronics system effects. Spectra are calculated for several materials, including HgI2 and CdTe, and are compared to experimental results.
  • Keywords
    Computational modeling; Electron traps; Germanium; Photonic band gap; Predictive models; Semiconductor device noise; Semiconductor materials; Temperature; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1975.4327641
  • Filename
    4327641