DocumentCode :
816012
Title :
Use of silicon bipolar transistors as sensors for neutron energy spectra determinations
Author :
Kelly, J.G. ; Griffin, P.J. ; Luera, T.F.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Volume :
38
Issue :
6
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Firstpage :
1180
Lastpage :
1186
Abstract :
Recent reevaluation of the neutron displacement damage function for silicon qualifies it as a sensor for spectra determinations. This development is especially useful in the critical energy region from 0.2 to 2.0 MeV where, in the absence of fission foils, there is a shortage of response functions needed to define spectra satisfactorily. How silicon bipolar devices can be used to improve neutron spectra determinations and therefore to better predict the displacement damage induced in devices is described
Keywords :
bipolar transistors; neutron detection and measurement; neutron effects; 0.2 to 2 MeV; Si; bipolar transistors; critical energy region; neutron displacement damage function; neutron energy spectra; response functions; sensors; Bipolar transistors; Electronic equipment testing; Energy measurement; Gamma ray detectors; Gamma rays; Integral equations; Isotopes; Laboratories; Neutrons; Silicon;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.124091
Filename :
124091
Link To Document :
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