Title :
The Spherical Drift Chamber for X-Ray Imaging Applications
Author :
Charpak, G. ; Hajduk, Z. ; Jeavons, A. ; Kahn, R. ; Stubbs, R.
Author_Institution :
CERN, Geneva, Switzerland
Abstract :
Properties of proportional chambers with spherical drift spaces have been investigated. An experiment of X-ray diffraction in crystals shows that an accuracy of 0.5 mm, at 20° inclination with respect to the axis of the chamber, can be obtained with 4 cm of drift length. Such chambers have many applications: X-ray diffraction patterns, pin-hole imaging, angular distributions of cascades of X-rays in nuclear physics, etc.
Keywords :
Argon; Cathodes; Crystals; Electrodes; Geometry; Testing; Wire; X-ray diffraction; X-ray imaging; Xenon;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1975.4327649