Title :
Improved method for gain/index measurements of semiconductor lasers
Author :
Bossert, D.J. ; Gallant, D.
Author_Institution :
LIDA, US Air Force Phillips Lab., Kirtland AFB, NM, USA
fDate :
2/15/1996 12:00:00 AM
Abstract :
An improved experimental method for measuring gain and refractive index in semiconductor lasers from below-threshold amplified spontaneous emission spectra is presented. Broad-area, as opposed to narrow-stripe width, diode lasers and a far-field spatial filtering technique are employed to eliminate uncertainties associated with lateral waveguiding and carrier confinement
Keywords :
gain measurement; laser variables measurement; refractive index measurement; semiconductor lasers; superradiance; amplified spontaneous emission spectra; broad-area diode lasers; carrier confinement; far-field spatial filtering; gain measurement; lateral waveguiding; refractive index measurement; semiconductor lasers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960193
