Refractive Index Profiling of a Core-Doped Photonic Crystal Fiber

Author

Youk, Youngchun ; Kim, Soan ; Oh, Kyunghwan ; Kim, Dug Young

Author_Institution

Dept. of Inf. & Commun., Gwangju Inst. of Sci. & Technol.

Volume

19

Issue

11

fYear

2007

fDate

6/1/2007 12:00:00 AM

Firstpage

810

Lastpage

812

Abstract

Direct refractive index profiling for a core-doped photonic crystal fiber with complex and nonsymmetric refractive index structure has been demonstrated for the first time. A new index profiling technique based on a reflectivity measurement technique using a confocal microscope has been employed. This improved, straightforward, and robust method enables us to measure the index structure of a complex structured fiber with high refractive index precision and spatial resolution

Keywords

optical fibre testing; optical microscopy; photonic crystals; reflectivity; refractive index; refractive index measurement; complex refractive index; complex structured fiber; confocal microscope; core-doped fiber; nonsymmetric refractive index; photonic crystal fiber; reflectivity measurement; refractive index precision; refractive index profiling; spatial resolution; Microscopy; Optical fiber devices; Optical fiber polarization; Optical fibers; Optical refraction; Optical variables control; Optical waveguides; Photonic crystal fibers; Reflectivity; Refractive index; Confocal microscope; index measurement; photonic crystal fiber (PCF); refractive index;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2007.895439

Filename

4162573