DocumentCode :
816325
Title :
Four decades of research on thermal contact, gap, and joint resistance in microelectronics
Author :
Yovanovich, M. Michael
Author_Institution :
Dept. of Mech. Eng., Univ. of Waterloo, Ont., Canada
Volume :
28
Issue :
2
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
182
Lastpage :
206
Abstract :
The Keynote Paper reviews and highlights over 40 years of research on solutions for steady-state and transient thermal constriction and spreading resistances, and thermomechanical models for contact, gap and joint resistances of joints formed by conforming rough surfaces, nonconforming smooth surfaces, and nonconforming rough surfaces. Microgap and macrogap thermal resistance and conductance models are reviewed, and important relations and correlation equations are presented. Contact microhardness, determined by Vickers indenters, are correlated and incorporated into the contact model for conforming rough surfaces. Microhardness parameters are correlated with Brinell hardness values. Elastoplastic contact models for joints formed by smooth sphere-smooth flat and conforming rough surfaces are presented. A simple thermomechanical model for microgaps occupied by oil, grease, grease filled with solid particles, and phase change materials such as paraffins is reviewed, and good agreement with recently published data is noted.
Keywords :
contact resistance; integrated circuit modelling; integrated circuits; microhardness; phase change materials; rough surfaces; thermal resistance; Brinell hardness; Vickers indenters; conductance models; conforming rough surfaces; contact microhardness; contact model; correlation equations; elastoplastic contact models; gap resistance; joint resistance; macrogap thermal resistance; microelectronics; microgap thermal resistance; nonconforming rough surfaces; nonconforming smooth surfaces; phase change materials; spreading resistances; steady-state thermal constriction; thermal contact; thermomechanical model; thermomechanical models; transient thermal constriction; Contact resistance; Equations; Microelectronics; Rough surfaces; Steady-state; Surface resistance; Surface roughness; Thermal conductivity; Thermal resistance; Thermomechanical processes; Microgap and macrogap thermal resistance; Vickers indenters; steady-state; transient thermal constriction;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2005.848483
Filename :
1432927
Link To Document :
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