DocumentCode :
816763
Title :
A Unified Analytic Drain–Current Model for Multiple-Gate MOSFETs
Author :
Yu, Bo ; Song, Jooyoung ; Yuan, Yu ; Lu, Wei-Yuan ; Taur, Yuan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California at San Diego, La Jolla, CA
Volume :
55
Issue :
8
fYear :
2008
Firstpage :
2157
Lastpage :
2163
Abstract :
In this paper, a unified analytic drain-current model is presented for various kinds of multiple-gate (MG) MOSFETs, including quadruple-gate (QG), triple-gate (TG), Pi-gate, and Omega-gate MOSFETs. The basis of the unified model lies in the analytic potential models previously developed for highly symmetric double-gate (DG) and surrounding-gate (SG) MOSFETs. A common characteristic for all MG MOSFETs is that the inversion charge in subthreshold is proportional to the silicon cross- sectional area (volume inversion), whereas the inversion charge above threshold is proportional to the gated perimeter of the silicon body. It is shown that the inversion charge in a QG MOSFET can be modeled by multiplying the inversion charge of SG MOSFET by a function that changes smoothly from unity in subthreshold to a factor larger than unity above threshold. Inasmuch as the inversion charge is expressed as a function of the gate voltage, the drain-current can be evaluated by using the Pao-Sah integral approach. Once the QG model is obtained, other TG, Pi-gate, and Omega-gate MOSFET models can be formulated as a linear combination of DG and QG MOSFETs. Numerical simulation results that validate the unified model are presented.
Keywords :
MOSFET; semiconductor device models; silicon; Omega-gate MOSFET; Pao-Sah integral approach; Pi-gate MOSFET; Si; double-gate MOSFET; multiple-gate MOSFET; quadruple-gate MOSFET; silicon cross-sectional area; surrounding-gate MOSFET; triple-gate MOSFET; unified analytic drain-current model; volume inversion charge; Differential equations; Logic; MOSFETs; Mathematical model; Numerical simulation; Poisson equations; Semiconductor device manufacture; Semiconductor device modeling; Silicon; Voltage; Compact model; MOSFETs; multiple-gate (MG);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2008.926228
Filename :
4578900
Link To Document :
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