• DocumentCode
    816832
  • Title

    Advanced High-Voltage 4H-SiC Schottky Rectifiers

  • Author

    Zhu, Lin ; Chow, T.P.

  • Author_Institution
    Rensselaer Polytech. Inst., Troy, NY
  • Volume
    55
  • Issue
    8
  • fYear
    2008
  • Firstpage
    1871
  • Lastpage
    1874
  • Abstract
    This paper presents advanced 4H-SiC high-voltage Schottky rectifiers with improved performance when compared to conventional 4H-SiC Schottky rectifiers. Two types of 4H-SiC junction barrier Schottky (JBS) rectifiers have been explored. These rectifiers offer Schottky-like ON-state and fast switching characteristics, while their OFF-state characteristics have a low leakage current similar to that of the PiN junction rectifier. Planar 4H-SiC JBS rectifiers, with more than 1-kV blocking capability and orders of magnitude lower reverse leakage current than that of conventional SiC Schottky rectifiers, have been demonstrated. In addition, a novel device structure, called lateral channel JBS rectifier, was designed and experimentally demonstrated in 4H-SiC with up to 1.5-kV blocking capability and pinlike reverse characteristics.
  • Keywords
    Schottky barriers; Schottky diodes; leakage currents; rectifying circuits; H-SiC; OFF-state characteristics; ON-state characteristics; blocking capability; high-voltage Schottky rectifier; junction barrier Schottky rectifier; lateral channel JBS rectifier; leakage current; pinlike reverse characteristics; Annealing; Breakdown voltage; Fabrication; Implants; Leakage current; P-n junctions; Rectifiers; Rough surfaces; Silicon carbide; Surface roughness; 4H-SiC; Junction Barrier Schottky (JBS); Schottky rectifier; power;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.926642
  • Filename
    4578907