DocumentCode
817
Title
Deep Trenches in
: Experimental Demonstration of Modulator Extinction Ratio Enhancement
Author
Pointel, Anne-Laure ; Ulliac, G. ; Pawela, Yvan ; Hauden, Jerome
Author_Institution
R&D, Photline Technol., Besançon, France
Volume
25
Issue
15
fYear
2013
fDate
Aug.1, 2013
Firstpage
1500
Lastpage
1502
Abstract
We benefit from the recent progress on lithium niobate deep etching to enhance the extinction ratios of Mach-Zehnder modulators. We demonstrate that a proper trench placed in between parallel arms can lead to a 15 dB-increase without any additional losses at 1550 nm.
Keywords
Mach-Zehnder interferometers; etching; lithium compounds; optical losses; optical modulation; LiNbO3; Mach-Zehnder modulator extinction ratio enhancement; deep trenches; lithium niobate deep etching; wavelength 1550 nm; Integrated optics; lithium niobate; microstructure; modulators; optical device fabrication;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2013.2270004
Filename
6544202
Link To Document