• DocumentCode
    817099
  • Title

    Direct evidence supporting the premises of a two-dimensional diode model for the parasitic thyristor in CMOS circuits built on thin epi

  • Author

    Chatterjee, Amitava ; Seitchik, Jerold A. ; Chern, Jue-Hsien ; Yang, Ping ; Wei, C.C.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • Volume
    9
  • Issue
    10
  • fYear
    1988
  • Firstpage
    509
  • Lastpage
    511
  • Abstract
    A key concept of a recent model to describe the holding point of thyristors in epitaxial CMOS is that due to conductivity modulation, the two-dimensional (2-D) thyristor is equivalent to a p-i-n diode of the same geometry. Here, the physical origin of negative resistance near the holding point is traced to resistance modulation in the epi. This positive feedback mechanism, inherent in the model, is conceptually different from that of the conventional model, in which negative resistance arises out of an increase in the feedback gain as the bipolar transistors come out of saturation. The I-V characteristics of thyristors and p-i-n diodes obtained from PISCES are shown to be almost identical. If the conventional mechanism were solely responsible for the negative resistance region, a thyristor would exhibit negative resistance while a 2-D diode would not. Experimental evidence showing that diodes exhibit negative resistance regions is presented to support the feedback mechanism of the model.<>
  • Keywords
    CMOS integrated circuits; negative resistance; semiconductor device models; thyristors; CMOS circuits; I-V characteristics; PIN diode; PISCES; epitaxial CMOS; holding point; negative resistance; p-i-n diode; parasitic thyristor; positive feedback mechanism; resistance modulation; thin epi; two-dimensional diode model; Bipolar transistors; Conductivity; Geometry; Negative feedback; P-i-n diodes; Semiconductor device modeling; Semiconductor process modeling; Solid modeling; Thyristors; Two dimensional displays;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.17827
  • Filename
    17827