DocumentCode
817260
Title
Determination of carrier lifetime from rectifier ramp recovery waveform
Author
Tien, Ben ; Hu, Chenming
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Volume
9
Issue
10
fYear
1988
Firstpage
553
Lastpage
555
Abstract
A charge-control analysis is used to obtain an expression relating the carrier lifetime to the realistic ramp recovery waveform of a p-i-n diode of arbitrary softness. The method is shown to produce a consistent lifetime for different values of forward currents, current ramp rates, and the resultant softness factors.<>
Keywords
carrier lifetime; semiconductor device testing; semiconductor diodes; solid-state rectifiers; PIN diode; carrier lifetime; charge-control analysis; current ramp rates; forward currents; p-i-n diode; rectifier ramp recovery waveform; softness factors; Charge carrier lifetime; Equations; Inductance; Measurement techniques; P-i-n diodes; P-n junctions; Rectifiers; Steady-state; Testing; Voltage;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.17842
Filename
17842
Link To Document