Title :
Determination of carrier lifetime from rectifier ramp recovery waveform
Author :
Tien, Ben ; Hu, Chenming
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
A charge-control analysis is used to obtain an expression relating the carrier lifetime to the realistic ramp recovery waveform of a p-i-n diode of arbitrary softness. The method is shown to produce a consistent lifetime for different values of forward currents, current ramp rates, and the resultant softness factors.<>
Keywords :
carrier lifetime; semiconductor device testing; semiconductor diodes; solid-state rectifiers; PIN diode; carrier lifetime; charge-control analysis; current ramp rates; forward currents; p-i-n diode; rectifier ramp recovery waveform; softness factors; Charge carrier lifetime; Equations; Inductance; Measurement techniques; P-i-n diodes; P-n junctions; Rectifiers; Steady-state; Testing; Voltage;
Journal_Title :
Electron Device Letters, IEEE
