DocumentCode :
817332
Title :
On the mathematical foundations of smoothness constraints for the determination of optical flow and for surface reconstruction
Author :
Snyder, M.A.
Author_Institution :
Dept. of Comput. & Inf. Sci., Massachusetts Univ., Amherst, MA, USA
Volume :
13
Issue :
11
fYear :
1991
fDate :
11/1/1991 12:00:00 AM
Firstpage :
1105
Lastpage :
1114
Abstract :
Gradient-based approaches to the computation of optical flow often use a minimization technique incorporating a smoothness constraint on the optical flow field. The author derives the most general form of such a smoothness constraint that is quadratic in first derivatives of the grey-level image intensity function based on three simple assumptions about the smoothness constraint: (1) it must be expressed in a form that is independent of the choice of Cartesian coordinate system in the image: (2) it must be positive definite; and (3) it must not couple different component of the optical flow. It is shown that there are essentially only four such constraints; any smoothness constraint satisfying (1), (2), or (3) must be a linear combination of these four, possibly multiplied by certain quantities invariant under a change in the Cartesian coordinate system. Beginning with the three assumptions mentioned above, the author mathematically demonstrates that all best-known smoothness constraints appearing in the literature are special cases of this general form, and, in particular, that the `weight matrix´ introduced by H.H. Nagel is essentially (modulo invariant quantities) the only physically plausible such constraint
Keywords :
computer vision; minimisation; Cartesian coordinate system; computer vision; gradient-based methods; grey-level image intensity function; minimization technique; optical flow; positive definite; smoothness constraints; surface reconstruction; weight matrix; Computer vision; Image motion analysis; Image reconstruction; Motion analysis; Optical computing; Optical coupling; Optical devices; Optical sensors; Surface reconstruction; Symmetric matrices;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.103272
Filename :
103272
Link To Document :
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