DocumentCode :
817418
Title :
Theoretical and experimental analysis on InAlGaAs/AlGaAs active region of 850-nm vertical-cavity surface-emitting lasers
Author :
Chang, Yi-An ; Chen, Jun-Rong ; Kuo, Hao-Chung ; Kuo, Yen-Kuang ; Wang, Shing-Chung
Author_Institution :
Inst. of Electro-Opt. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Volume :
24
Issue :
1
fYear :
2006
Firstpage :
536
Lastpage :
543
Abstract :
In this study, the gain-carrier characteristics of In0.02Ga0.98As and InAlGaAs quantum wells (QWs) of variant In and Al compositions with an emission wavelength of 838 nm are theoretically investigated. More compressive strain, caused by higher In and Al compositions in InAlGaAs QW, is found to provide higher material gain, lower transparency carrier concentration, and transparency radiative current density over the temperature range of 25-95°C. To improve the output characteristics and high-temperature performance of 850-nm vertical-cavity surface-emitting laser (VCSEL), In0.15Al0.08Ga0.77As/Al0.3Ga0.7As is utilized as the active region, and a high-bandgap 10-nm-thick Al0.75Ga0.25As electronic blocking layer is employed for the first time. The threshold current and slope efficiency of the VCSEL with Al0.75Ga0.25As at 25°C are 1.33 mA and 0.53 W/A, respectively. When this VCSEL is operated at an elevated temperature of 95°C, the increase in threshold current is less than 21% and the decrease in slope efficiency is approximately 24.5%. A modulation bandwidth of 9.2 GHz biased at 4 mA is demonstrated.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; optical communication equipment; quantum well lasers; surface emitting lasers; 1.33 mA; 10 nm; 25 to 95 degC; 4 mA; 850 nm; 9.2 GHz; InAlGaAs-AlGaAs; InAlGaAs/AlGaAs active region; VCSEL; electronic blocking layer; gain-carrier characteristics; slope efficiency; threshold current; transparency carrier; transparency radiative current density; vertical-cavity surface-emitting lasers; Capacitive sensors; Composite materials; Current density; Laser theory; Optical materials; Quantum mechanics; Quantum well lasers; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers; 850-nm VCSEL; Electronic blocking layer; InAlGaAs/AlGaAs; MOCVD; gain modeling; semiconductor lasers;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2005.860156
Filename :
1589085
Link To Document :
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