Title :
Reliable eye-diagram analysis of data links via device macromodels
Author :
Stievano, Igor S. ; Maio, Ivan A. ; Canavero, Flavio G. ; Siviero, Claudio
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Abstract :
This paper addresses the impact of device macromodels on the accuracy of signal integrity and performance predictions for critical digital interconnecting systems. It exploits nonlinear parametric models for both single-ended and differential devices, including the effects of power supply fluctuations and receiver bit detection. The analysis demonstrates that the use of well-designed macromodels dramatically speeds up the simulation as well it preserves timing accuracy even for long bit sequences.
Keywords :
digital integrated circuits; equivalent circuits; integrated circuit interconnections; integrated circuit modelling; circuit modeling; data links; device macromodels; digital integrated circuits; digital interconnecting systems; electromagnetic compatibility; eye-diagram analysis; nonlinear parametric models; power supply fluctuations; receiver bit detection; signal integrity; system identification; timing accuracy; Bit error rate; Computational modeling; Data analysis; Electromagnetic interference; Fluctuations; Integrated circuit interconnections; Power supplies; Predictive models; Signal design; Timing; Circuit modeling; digital integrated circuits; electromagnetic compatibility; macromodeling; signal integrity; system identification;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2005.862645
