• DocumentCode
    817911
  • Title

    Spacecraft charging thresholds in single and double Maxwellian space environments

  • Author

    Lai, Shu T.

  • Author_Institution
    Philips Lab., Hanscom AFB, MA, USA
  • Volume
    38
  • Issue
    6
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    1629
  • Lastpage
    1634
  • Abstract
    With the single Maxwellian electron distribution model of space environment, the results suggest that the ambient electron temperature is the only decisive parameter controlling the onset of spacecraft charging. The value of the critical temperature is a property of the surface material. The ambient electron density has no influence on the onset at all. With the double Maxwellian electron and ion model of space environment, the results suggest that positive charging, negative charging, triple-root charging, and of course, no charging are all possible behaviors. A domain diagram for various behaviors is presented as an example. In the triple-root situation, the middle root is unstable. The spacecraft potential may require either of the static roots; which root is acquired depends on the initial condition and the way the environment changes in time. Hysteresis of spacecraft potential may occur. The critical or threshold temperature derived in the single Maxwellian model plays an important role in the triple-root condition of the double Maxwellian model
  • Keywords
    radiation effects; space vehicles; ambient electron temperature; double Maxwellian space environments; hysteresis; ion model; negative charging; positive charging; single Maxwellian electron distribution model; spacecraft charging; spacecraft potential; static roots; triple-root charging; Aircraft manufacture; Electron emission; Magnetic field measurement; Plasma density; Plasma measurements; Plasma temperature; Space charge; Space vehicles; Surface charging; Weather forecasting;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.124155
  • Filename
    124155