DocumentCode :
817916
Title :
Macromodeling of nonlinear digital I/O drivers
Author :
Mutnury, Bhyrav ; Swaminathan, Madhavan ; Libous, James P.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
29
Issue :
1
fYear :
2006
Firstpage :
102
Lastpage :
113
Abstract :
In this paper, a modeling technique using spline functions with finite time difference approximation is discussed for modeling moderately nonlinear digital input/output (I/O) drivers. This method takes into account both the static and the dynamic memory characteristics of the driver during modeling. Spline function with finite time difference approximation includes the previous time instances of the driver output voltage/current to capture the output dynamic characteristics of digital drivers accurately. In this paper, the speed and the accuracy of the proposed method is analyzed and compared with the radial basis function (RBF) modeling technique, for modeling different test cases. For power supply noise analysis, the proposed method has been extended to multiple ports by taking the previous time instances of the power supply voltage/current into account. The method discussed can be used to capture sensitive effects like simultaneous switching noise (SSN) and cross talk accurately when multiple drivers are switching simultaneously. A comparison study between the presented method and the transistor level driver models indicate a computational speed-up in the range of 10-40 with an error of less than 5%. For highly nonlinear drivers, a method based on recurrent artificial neural networks (RNN) is discussed.
Keywords :
driver circuits; finite difference time-domain analysis; integrated circuit modelling; integrated circuit noise; nonlinear network analysis; radial basis function networks; splines (mathematics); black-box model; buffer information specification models; crosstalk; finite time difference approximation; nonlinear digital input/output drivers; power supply noise analysis; radial basis function modeling; recurrent artificial neural networks; simultaneous switching noise; spline functions; transistor level driver models; Circuit simulation; Computational modeling; Digital systems; Driver circuits; Power supplies; Recurrent neural networks; Spline; Testing; Timing; Voltage; Black-box model; Input/output buffer information specification (IBIS) models; Radial Basis Function (RBF); Recurrent Neural Network (RNN); Simultaneous switching noise (SSN); Spline function; finite time difference;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2005.848396
Filename :
1589137
Link To Document :
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