• DocumentCode
    817945
  • Title

    An overview of electrical characterization techniques and theory for IC packages and interconnects

  • Author

    McGibney, Eoin ; Barrett, John

  • Author_Institution
    Centre for Adaptive Wireless Syst., Cork Inst. of Technol., Ireland
  • Volume
    29
  • Issue
    1
  • fYear
    2006
  • Firstpage
    131
  • Lastpage
    139
  • Abstract
    This paper reviews current approaches to the electrical characterization and modeling of IC packages and interconnects. An overview of both frequency and time-domain measurement methods and summaries of equivalent circuit model selection and extraction methodologies are included. Additionally, an overview of numerical methods for electromagnetic modeling is included for completeness. Finally, relevant case studies from the literature are summarized to further supplement the discussed techniques. The focus is primarily on high-frequency signal related characterization and power integrity issues are not directly considered in this paper. This paper is presented in the context of the growing requirement for package and interconnection electrical models for high-speed and miniaturized systems.
  • Keywords
    equivalent circuits; frequency-domain analysis; integrated circuit interconnections; integrated circuit measurement; integrated circuit packaging; time-domain analysis; electromagnetic modeling; equivalent circuit model; frequency-domain measurement methods; integrated circuit interconnects; integrated circuit modeling; integrated circuit package; time-domain measurement methods; Context modeling; Electromagnetic measurements; Electromagnetic modeling; Equivalent circuits; Frequency measurement; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit packaging; Power system interconnection; Time domain analysis; Electrical characterization; equivalent circuit modeling; frequency domain; measurements; time domain;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2005.849550
  • Filename
    1589140