• DocumentCode
    818047
  • Title

    A new test setup and method for the calibration of current clamps

  • Author

    Pommerenke, David ; Chundru, Ramachandran ; Chandra, Sunitha

  • Author_Institution
    Electromagn. Compatibility Lab., Univ. of Missouri-Rolla, Rolla, MO, USA
  • Volume
    47
  • Issue
    2
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    335
  • Lastpage
    343
  • Abstract
    Current probes are widely used to measure the common mode currents in electromagnetic compatibility (EMC) applications. Often, it is necessary to characterize the ratio of measured voltage to the common mode currents up to gigahertz (GHz) frequencies. Existing calibration methods for current probes suffer from the problem of not directly measuring the current within the current clamp. Instead they either reconstruct the current from measurements at other locations or they use assumptions regarding the geometry which allows them to use a current that is measured at a different location without applying a mathematical correction. For example, by maintaining a 50-Ω transmission-line impedance the current can be determined with low uncertainty. The proposed method overcomes these disadvantages by directly measuring the current at the center of the current clamp. This way the mechanical dimensions of the test setup are not critical any more, i.e., one setup can be easily used to measure a large variety of clamps. The method is primarily applicable for current monitoring probes in the frequency domain.
  • Keywords
    calibration; electric current measurement; electromagnetic compatibility; frequency-domain analysis; monitoring; probes; EMC; common mode currents measurement; current clamps calibration; current monitoring probes; current probes; electromagnetic compatibility; frequency domain; test setup; Calibration; Clamps; Current measurement; Electromagnetic compatibility; Electromagnetic measurements; Frequency measurement; Geometry; Probes; Testing; Voltage measurement; Calibration; current clamp; current probe; transfer function; transfer impedance;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2005.847381
  • Filename
    1433058