DocumentCode

818219

Title

Status of a silicon lattice measurement and dissemination exercise

Author

Deslattes, Richard D. ; Kessler, Ernest G., Jr.

Author_Institution

National Institute of Standards and Technology

Volume

40

Issue

2

fYear

1991

fDate

4/1/1991 12:00:00 AM

Firstpage

92

Lastpage

97

Keywords

Frequency estimation; Frequency measurement; Goniometers; Lattices; Mass spectroscopy; Motion measurement; NIST; Optical interferometry; Silicon; X-ray diffraction;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.1990.1032890

Filename

1032890