Title :
Status of a silicon lattice measurement and dissemination exercise
Author :
Deslattes, Richard D. ; Kessler, Ernest G., Jr.
Author_Institution :
National Institute of Standards and Technology
fDate :
4/1/1991 12:00:00 AM
Keywords :
Frequency estimation; Frequency measurement; Goniometers; Lattices; Mass spectroscopy; Motion measurement; NIST; Optical interferometry; Silicon; X-ray diffraction;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1990.1032890
