DocumentCode
818235
Title
A quantitative technique to analyze materials trade-off for SEM `E´
Author
Ng, Lee H. ; Field, Frank R.
Author_Institution
IBIS Asociates Inc., Wellesley, MA, USA
Volume
15
Issue
1
fYear
1992
fDate
2/1/1992 12:00:00 AM
Firstpage
78
Lastpage
86
Abstract
The standard electronic module (SEM) is defined by a Department of Defense specification designed to optimize electronic module materials and designs for the military, as well as to reduce system life cycle cost through standardization of design and test requirements. The size of the module is defined by its format designation. For example, the E format specifies a substrate dimension of 133 mm (5.25 in) by 152.4 mm (6 in). However, the specification does not define the materials composing the substrate, leaving material specification to the module designer. The performance requirements for SEM E are evaluated using a technique called multiattribute utility analysis (MAUA). This technique has been employed in a wide range of engineering problems in general, and materials specification problems in particular, and its application to this problem yields rich insights into the critical elements of materials selection for the SEM E application
Keywords
design engineering; hybrid integrated circuits; military equipment; packaging; 133 mm; 152.4 mm; Department of Defense specification; E format; MAUA; SEM E; electronic module materials; format designation; materials selection; materials specification; materials trade-off; module size; multiattribute utility analysis; multichip modules; performance requirements; quantitative technique; standard electronic module; standardization of design; substrate dimension; system life cycle cost; test requirement standardization; Cost function; Design engineering; Design optimization; Electronic equipment testing; Life testing; Military standards; Performance analysis; Printed circuits; Reliability engineering; Standardization;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/33.124195
Filename
124195
Link To Document