Title :
Resistance computations for multilayer packaging structures by applying the boundary element method
Author_Institution :
Dept. of Electr. Eng., Nat Taiwan Univ., Taipei, Taiwan
fDate :
2/1/1992 12:00:00 AM
Abstract :
A boundary element formulation together with the moment method analysis is proposed to find the equivalent multiport DC resistances for packaging structures consisting of uniform conducting plates with arbitrarily shaped boundaries. Incorporated with a new equiangle division scheme and exact integration formulas, this approach is very efficient in the use of computer storage and computation time, allowing many practical structures to be dealt with even by a small personal computer. The method is employed to investigate the effect on the equivalent resistances due to the presence of the interior apertures and the exterior boundary. Also presented are the resistance modeling technique for the multilayer packaging structures and a novel cut and fill technique to estimate the resistances of complicated structures
Keywords :
boundary-elements methods; circuit analysis computing; computational complexity; hybrid integrated circuits; microcomputer applications; arbitrarily shaped boundaries; boundary element formulation; boundary element method; computation time; computer storage; cut and fill technique; equiangle division scheme; exact integration formulas; moment method analysis; multilayer packaging structures; multiport DC resistances; packaging structures; personal computer; resistance computations; resistance modeling technique; uniform conducting plates; Boundary element methods; Circuit analysis; Distributed computing; Geometry; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Nonhomogeneous media; Power distribution; Voltage;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
