Title :
Single-event-upset-like fault injection: a comprehensive framework
Author :
Faure, Fabien ; Velazco, Raoul ; Peronnard, Paul
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
An approach to reproduce radiation ground testing results for the study of microprocessors vulnerability to single event upset (SEU) is described in this paper. Resulting cross-sections fit very well with measured ones.
Keywords :
field programmable gate arrays; integrated circuit testing; microprocessor chips; radiation hardening (electronics); FPGA based fault injection; microprocessors vulnerability; radiation ground testing; single event upset; Application software; Benchmark testing; Hardware; Helium; Microprocessors; Registers; SPICE; Single event upset; Software measurement; Writing; Fault injection; microprocessor; single event upsets;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.860689
