• DocumentCode
    818441
  • Title

    The Weibull–Lognormal Fading Channel: Analysis, Simulation, and Validation

  • Author

    Karadimas, Petros ; Kotsopoulos, Stavros A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Patras, Rio-Patras, Greece
  • Volume
    58
  • Issue
    7
  • fYear
    2009
  • Firstpage
    3808
  • Lastpage
    3813
  • Abstract
    In frequency-nonselective fading channels, the partial waves arriving at the mobile receiver cannot explicitly be of homogeneous nature due to nonuniform scattering caused by objects of specific reflective nature. Moreover, shadowing influences the received signal level by causing slow variations to its local mean. In this paper, we investigate a mixture stochastic process accounting for both inhomogeneous scattering and shadow fading by multiplying a Weibull process with a lognormal process. The first process models the possible scattering nonuniformities of the channel, whereas the second process accounts for the slow-term variations of the local mean due to shadowing. An exact solution for the composite probability density function (pdf) will be given, together with approximate solutions for the second-order statistics, i.e., the level crossing rate (LCR) and the average duration of fades (ADF). The approximate solutions come from the assumption of a slowly time-varying lognormal process compared with the Weibull process, the validity of which will be tested via an efficient deterministic simulation scheme that implements the analytical model on a digital computer. Finally, a curve fitting of the LCR to real-world data drawn from channel measurements will demonstrate the flexibility and usefulness of the proposed model.
  • Keywords
    Weibull distribution; electromagnetic wave scattering; fading channels; higher order statistics; stochastic processes; Weibull-Lognormal fading channel; frequency-nonselective fading channels; level crossing rate; mobile receiver; nonuniform scattering; probability density function; received signal level; second-order statistics; shadowing influence; stochastic processes; Fading channels; Suzuki process; Weibull fading; nonuniform scattering; shadowing;
  • fLanguage
    English
  • Journal_Title
    Vehicular Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9545
  • Type

    jour

  • DOI
    10.1109/TVT.2008.2002697
  • Filename
    4579736