Title :
Compact physical IR-drop models for chip/package co-design of gigascale integration (GSI)
Author :
Shakeri, Kaveh ; Meindl, James D.
Author_Institution :
Cypress Semicond., San Jose, CA, USA
fDate :
6/1/2005 12:00:00 AM
Abstract :
The supply voltage decrease and power density increase of future GSI chips demand accurate models for the IR-drop. Compact physical IR-drop models of on-chip power/ground distribution networks are derived for two generic types of packages. In the early stages of design, these models enable accurate estimates of all required power/ground grid interconnect dimensions and chip pad counts that are needed for power distribution. The models also quantify the tradeoff between on-chip interconnect dimensions and the number of I/O pads required for power distribution and therefore enable rigorous chip/package co-design. Comparison with SPICE simulations show less than 1% and 5% error for the wire-bond package and the flip-chip package, respectively.
Keywords :
SPICE; VLSI; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; lead bonding; SPICE simulations; chip pad counts; chip/package co-design; compact physical IR-drop models; flip-chip package; gigascale integration; on-chip power/ground distribution networks; power/ground grid interconnect dimensions; very large-scale integration; wire-bond package; Current density; Large scale integration; Microprocessors; Network-on-a-chip; Packaging; Power distribution; Power systems; Routing; SPICE; Voltage; Flip-chip devices; interconnections; modeling; power distribution; very large-scale integration (VLSI);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2005.848125