Title :
Physical modeling and design of thin-film SOI lateral PIN photodiodes
Author :
Afzalian, Aryan ; Flandre, Denis
Author_Institution :
Microelectron. Lab., Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium
fDate :
6/1/2005 12:00:00 AM
Abstract :
Lateral PIN diodes on thin-film silicon-on-insulator (SOI) substrates are photodetectors of prime interest for UV and fast IR applications. We present numerical simulations and a simple but accurate way to implement 1-D internal physical modeling of such devices. This modeling allows for the optimization of their external and macroscopic performances such as quantum efficiency and output current as a function of design parameters such as intrinsic length of the diode. Speed and dark current performances versus the intrinsic length are also addressed, and design tradeoffs are illustrated by concrete applications. For diodes with intrinsic lengths between 2 to 4 μm, our results predict quantum efficiencies of 56% to 60% at a 400-nm wavelength, with bandwidth of 1 to 10 GHz and a dark current of around 1 pA for a total diode area of 75×75 μm2 in a 0.12 μm partially depleted SOI technology.
Keywords :
integrated circuit modelling; integrated optoelectronics; p-i-n photodiodes; silicon-on-insulator; 0.12 micron; 1 pA; 1 to 10 GHz; 2 to 4 micron; 400 nm; 56 to 60 percent; dark current performances; integrated optoelectronics; intrinsic length; lateral PIN photodiodes; macroscopic performances; numerical simulations; optical communication; optical receivers; optoelectronic devices; photodetectors; physical design; physical modeling; quantum efficiency; semiconductor device modeling; silicon-on-insulator technology; speed performance; thin-film SOI; ultraviolet detectors; Dark current; Design optimization; Diodes; Numerical simulation; PIN photodiodes; Photodetectors; Semiconductor thin films; Silicon on insulator technology; Substrates; Transistors; Integrated optoelectronics; optical communication; optical receivers; optoelectronic devices; p-i-n photodiodes; photodetectors; photodiodes; semiconductor device modeling; silicon-on-insulator (SOI) technology; ultraviolet detectors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2005.848080