• DocumentCode
    818556
  • Title

    Physical modeling and design of thin-film SOI lateral PIN photodiodes

  • Author

    Afzalian, Aryan ; Flandre, Denis

  • Author_Institution
    Microelectron. Lab., Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium
  • Volume
    52
  • Issue
    6
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    1116
  • Lastpage
    1122
  • Abstract
    Lateral PIN diodes on thin-film silicon-on-insulator (SOI) substrates are photodetectors of prime interest for UV and fast IR applications. We present numerical simulations and a simple but accurate way to implement 1-D internal physical modeling of such devices. This modeling allows for the optimization of their external and macroscopic performances such as quantum efficiency and output current as a function of design parameters such as intrinsic length of the diode. Speed and dark current performances versus the intrinsic length are also addressed, and design tradeoffs are illustrated by concrete applications. For diodes with intrinsic lengths between 2 to 4 μm, our results predict quantum efficiencies of 56% to 60% at a 400-nm wavelength, with bandwidth of 1 to 10 GHz and a dark current of around 1 pA for a total diode area of 75×75 μm2 in a 0.12 μm partially depleted SOI technology.
  • Keywords
    integrated circuit modelling; integrated optoelectronics; p-i-n photodiodes; silicon-on-insulator; 0.12 micron; 1 pA; 1 to 10 GHz; 2 to 4 micron; 400 nm; 56 to 60 percent; dark current performances; integrated optoelectronics; intrinsic length; lateral PIN photodiodes; macroscopic performances; numerical simulations; optical communication; optical receivers; optoelectronic devices; photodetectors; physical design; physical modeling; quantum efficiency; semiconductor device modeling; silicon-on-insulator technology; speed performance; thin-film SOI; ultraviolet detectors; Dark current; Design optimization; Diodes; Numerical simulation; PIN photodiodes; Photodetectors; Semiconductor thin films; Silicon on insulator technology; Substrates; Transistors; Integrated optoelectronics; optical communication; optical receivers; optoelectronic devices; p-i-n photodiodes; photodetectors; photodiodes; semiconductor device modeling; silicon-on-insulator (SOI) technology; ultraviolet detectors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.848080
  • Filename
    1433104