DocumentCode :
818609
Title :
Three-Dimensional Optical Circuits Consisting of Waveguide Films and Optical Z-Connections
Author :
Yoshimura, Tetsuzo ; Miyazaki, Masayoshi ; Miyamoto, Yosuke ; Shimoda, Noriyuki ; Hori, Akihide ; Asama, Kunihiko
Author_Institution :
Dept. of Electron., Tokyo Univ. of Technol., Hachioji
Volume :
24
Issue :
11
fYear :
2006
Firstpage :
4345
Lastpage :
4352
Abstract :
Two types of three-dimensional (3-D) optical circuits based on waveguide films are proposed and experimentally demonstrated. Type 1 is "Stacked waveguide films with 45deg mirrors". Waveguide films with 70-mum-thick undercladding layers and 32-mum-wide cores with air cladding are fabricated by the built-in mask method using photo-definable materials. The films are stacked by contacting their undercladding layers. Optical Z-connections are formed by aligning the 45deg mirrors in upper and lower films. The mirror-to-mirror distance is ~170 mum. When a probe beam of 650 nm or 1.3 mum in wavelength is introduced into input in the first film, it is transmitted to the second film through optical Z-connection and is observed at output. Loss at the optical Z-connection for 1.3-mum wavelength is ~14 dB, which might be due to leakage of probe beams reflected from the mirror with large diverging angles. Type 2 is "Waveguide films with vertical waveguides". After coating a photo-refractive layer of 500-mum thickness on the back of a cladding layer of a waveguide film, a 405-nm wavelength write beam is introduced into input. Then, a vertical waveguide of 3-D self-organized lightwave network (3-D SOLNET) is grown in the photo-refractive layer above a 45deg mirror. A probe beam guided in the vertical waveguide is observed with a beam size close to that in the core of the waveguide film. Loss reduction at the optical Z-connection is expected by combining optical circuits of Types 1 and 2 to insert the 3-D SOLNET between waveguide films as well as by decreasing cladding layer thicknesses
Keywords :
claddings; mirrors; optical fabrication; optical films; optical interconnections; optical waveguides; photorefractive materials; 1.3 mum; 3-D self-organized lightwave network; 32 mum; 45deg mirror; 650 nm; 70 mum; built-in mask method; optical z-connections; photorefractive layer; three-dimensional optical circuits; undercladding layers; vertical waveguide; waveguide films; Circuits; Mirrors; Optical attenuators; Optical crosstalk; Optical fiber networks; Optical films; Optical interconnections; Optical waveguides; Probes; Wiring; Built-in mask method; optical Z-connections; optical circuits; optical interconnects; optical switching systems; self-organized lightwave network (SOLNET); three-dimensional (3-D); vertical waveguides; waveguide films;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2006.883679
Filename :
4012240
Link To Document :
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