Title :
LYM-type inequalities for tEC/AUED codes
Author :
Zhang, Zhen ; Xia, Xiang-Gen
Author_Institution :
Dept. of Electr. Eng.-Syst., Univ. of Southern California, Los Angeles, CA, USA
fDate :
1/1/1993 12:00:00 AM
Abstract :
Some LYM-type inequalities are introduced to obtain a relationship between the parameters of t-error correcting/all unidirectional error-detecting codes of length n. As an application of these inequalities, new lower bounds on the redundancies of systematic t EC/AUED codes are derived and an extensive table is given
Keywords :
error correction codes; error detection codes; redundancy; LYM-type inequalities; lower bounds; redundancy; systematic codes; t-error correcting/all unidirectional error-detecting codes; tEC/AUED codes; Conferences; Constraint theory; Convolutional codes; Electrons; Error correction codes; Hamming distance; Modulation coding; Notice of Violation; Optical fibers; Redundancy; Welding;
Journal_Title :
Information Theory, IEEE Transactions on
