DocumentCode :
818716
Title :
Investigating the use of multimeters to measure quantized hall resistance standards
Author :
Cage, Marvin E. ; Yu, Dingyi ; Jeckelmann, Beat M. ; Steiner, Richard L. ; Duncan, Robert V.
Author_Institution :
National Institute of Science and Technology
Volume :
40
Issue :
2
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
262
Lastpage :
266
Keywords :
Calibration; Cryogenics; Electric resistance; Electrical resistance measurement; Laboratories; Measurement standards; Metrology; NIST; Resistors; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1990.1032933
Filename :
1032933
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=818716
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