• DocumentCode
    81872
  • Title

    Built-In EVM Measurement With Negligible Hardware Overhead

  • Author

    Yilmaz, Ender ; Nassery, Afsaneh ; Ozev, Sule

  • Author_Institution
    Freescale Semicond., Austin, TX, USA
  • Volume
    31
  • Issue
    1
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    75
  • Lastpage
    82
  • Abstract
    This article presents an all-digital, built-in method for measuring EVM that alleviates the need for sophisticated external test equipment and speeds up test application time.
  • Keywords
    built-in self test; error analysis; test equipment; all-digital method; built-in EVM measurement; error vector magnitude; negligible hardware overhead; sophisticated external test equipment; test application time; Discrete Fourier transforms; Error correction; OFDM; Radio frequency; Receivers; Transmitters; Vectors;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2013.2265164
  • Filename
    6522140
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=81872