Title :
Built-In EVM Measurement With Negligible Hardware Overhead
Author :
Yilmaz, Ender ; Nassery, Afsaneh ; Ozev, Sule
Author_Institution :
Freescale Semicond., Austin, TX, USA
Abstract :
This article presents an all-digital, built-in method for measuring EVM that alleviates the need for sophisticated external test equipment and speeds up test application time.
Keywords :
built-in self test; error analysis; test equipment; all-digital method; built-in EVM measurement; error vector magnitude; negligible hardware overhead; sophisticated external test equipment; test application time; Discrete Fourier transforms; Error correction; OFDM; Radio frequency; Receivers; Transmitters; Vectors;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2265164
