• DocumentCode
    818720
  • Title

    Wavelength shift of gallium nitride light emitting diode with p-down structure

  • Author

    Lan, Wen-How

  • Author_Institution
    Dept. of Electr. Eng., Nat. Univ. of Kaohsiung, Taiwan
  • Volume
    52
  • Issue
    6
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    1217
  • Lastpage
    1219
  • Abstract
    Both the p-gallium nitride (GaN) on an n-light-emitting diode (LED) structure and the n-GaN on p-LED structure were fabricated by metal-organic vapor phase epitaxy on c axis sapphire substrate. The output spectra with different applied bias voltages were studied on these structures. The small amount of the wavelength shift under a forward bias condition in the proposed p-down LED structure was observed but not in the n-down LED structure. This phenomenon was characterized by the effective electric field in the well created from the built-in electric field and the applied electric field. This proposed p-down LED shows an opportunity in the application of wavelength shift-free optoelectronic devices.
  • Keywords
    MOCVD; MOCVD coatings; electroluminescence; gallium compounds; light emitting diodes; semiconductor quantum wells; GaN; effective electric field; electroluminescence; light emitting diode; metal-organic vapor phase epitaxy; multiple-quantum well; optoelectronic devices; p-down structure; sapphire substrate; wavelength shift; Annealing; Buffer layers; Gallium nitride; III-V semiconductor materials; Light emitting diodes; Luminescence; Ohmic contacts; Optoelectronic devices; Quantum well devices; Substrates; Electroluminescence (EL); light-emitting diodes (LEDs); multiple-quantum well (MQW); p-down; wavelength shift;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.848114
  • Filename
    1433119