DocumentCode :
818742
Title :
Hermetic Packaging Using Eutectic SnPb Solder and Cr/Ni/Cu Metallurgy Layer
Author :
Huang, Annie T. ; Chou, Chung-Kuang ; Chen, Chih
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Chiao Tung Univ., Hsinchu
Volume :
29
Issue :
4
fYear :
2006
Firstpage :
760
Lastpage :
765
Abstract :
We have developed an easy, low-cost, and low-temperature optoelectronic hermetic packaging technology utilizing the eutectic SnPb solder and the Cr/Ni/Cu bonding pad. Bonding characteristics of the design were investigated in three different setups: silicon-silicon, silicon-glass, and glass-glass samples. Hermeticity was achieved at 200 degC without flux for all samples during the final bonding process. The bonding pads did not dewet during or after the reflow process. By utilizing the eutectic SnPb solder, the self-alignment process can be achieved. Because the bonding process was conducted through visual alignment, original misalignment was estimated to be more than 100 mum. The surface tension of melting solder during the reflow process allowed the samples to self-align and obtain a misalignment of less than 20 mum after solidification, which was 4% of the entire solder width. The bonding strength of the three setups ranged from 3 to 10 MPa. Among the three setups, glass-glass samples appear to have the strongest bonding strength. This low-temperature and cost-effective soldering process has demonstrated its feasibility and potential utilization in optoelectronic packaging
Keywords :
chromium; copper; hermetic seals; integrated circuit packaging; lead alloys; nickel; optoelectronic devices; reflow soldering; semiconductor device packaging; solders; tin alloys; 200 C; 3 to 10 MPa; Cr-Ni-Cu; Cr/Ni/Cu metallurgy layer; SnPb; bonding pads; bonding process; eutectic SnPb solder; flux free; hermetic packaging; integrated circuit packaging; optoelectronic technology; reflow process; self alignment; semiconductor device packaging; surface tension; thin film circuit packaging; visual alignment; Bonding processes; Chromium; Electronics packaging; Heating; Integrated circuit packaging; Materials science and technology; Moisture; Semiconductor device packaging; Soldering; Temperature; Flux-free; hermetic packaging; integrated circuit packaging; semiconductor device packaging; soldering; thin-film circuit packaging;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2006.879427
Filename :
4012253
Link To Document :
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