• DocumentCode
    818811
  • Title

    Computer-Aided Design for Low-Power Robust Computing in Nanoscale CMOS

  • Author

    Sylvester, Dennis ; Srivastava, Ashish

  • Author_Institution
    Michigan Univ., Ann Arbor, MI
  • Volume
    95
  • Issue
    3
  • fYear
    2007
  • fDate
    3/1/2007 12:00:00 AM
  • Firstpage
    507
  • Lastpage
    529
  • Abstract
    This work argues that the foremost challenges to the continued rapid improvements in CMOS integrated circuit (IC) performance are power consumption and design robustness. Furthermore, these two goals are often contradictory in nature, which indicates that joint optimization approaches must be adopted to properly handle both. To highlight needs in computer-aided design (CAD), we review a sampling of state-of-the-art work in power reduction techniques, and also in the newly emerging area of statistical optimization applied to very large scale integration (VLSI) ICs. The lack of CAD techniques to perform multiobjective function optimization (specifically parametric yield under correlated performance metrics) is a major limitation of current CAD research. In addition, with design trends pushing towards architectures based on aggressive adaptivity and voltage scaling, CAD researchers and engineers will need to refocus efforts on enabling this type of complex design
  • Keywords
    CMOS integrated circuits; circuit CAD; circuit optimisation; integrated circuit design; low-power electronics; sampling methods; CAD; VLSI integrated circuit; aggressive adaptivity; computer-aided design; design trends; joint optimization approaches; low-power robust computing; multiobjective function optimization; nanoscale CMOS integrated circuit; parametric yield; power reduction; statistical optimization; voltage scaling; CMOS integrated circuits; Design automation; Design engineering; Design optimization; Energy consumption; Measurement; Robustness; Sampling methods; Very large scale integration; Voltage; CMOS; integrated circuits; low-power; parametric yield;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2006.889370
  • Filename
    4167780