Title :
Sub-ppm linearity testing of a DMM using a Josephson Junction array
Author_Institution :
Hewlett Packard
fDate :
4/1/1991 12:00:00 AM
Keywords :
Instruments; Josephson junctions; Linearity; NIST; Performance evaluation; Pulse measurements; Switches; Testing; Voltage; Voltmeters;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1990.1032951
