Title :
Complex upset mitigation applied to a Re-configurable embedded processor
Author :
Rezgui, S. ; Swift, G. ; Somervill, K. ; George, J. ; Carmichael, C. ; Allen, G.
Author_Institution :
Xilinx Inc., San Jose, CA, USA
Abstract :
Soft-core processors implemented in static random access memory-based field-programmable-gate-arrays, while attractive to spacecraft designers, require upset mitigation. We investigate a proposed solution involving two levels of scrubbing plus triple modular redundancy and measure its in-beam performance.
Keywords :
SRAM chips; field programmable gate arrays; reconfigurable embedded processor; scrubbing; soft-core processors; spacecraft designers; static random access memory-based field-programmable-gate-arrays; triple modular redundancy; upset mitigation; Embedded system; Field programmable gate arrays; Flip-flops; Laboratories; NASA; Propulsion; Protection; Redundancy; Space technology; Testing; Embedded processors; field-programmable-gate-arrays (FPGAs); radiation testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.860743
