• DocumentCode
    819037
  • Title

    Bloch-wave engineering for high-Q, small-V microcavities

  • Author

    Lalanne, Ph. ; Hugonin, Jean Paul

  • Author_Institution
    Centre Nat. de la Recherche Scientifique, Univ. Paris Sud, Orsay, France
  • Volume
    39
  • Issue
    11
  • fYear
    2003
  • Firstpage
    1430
  • Lastpage
    1438
  • Abstract
    The overall decay rate of the mode in an optical microcavity formed by a defect surrounded by two Bragg mirrors in a monomode waveguide is driven by two mechanisms, the desired coupling to a guided mode and the detrimental coupling to radiation modes. We propose two approaches fully compatible with planar fabrication, which allow to increase the cavity Q´s by several orders of magnitude while keeping constant the mode volume V of the cavity. The first approach consists of engineering the mirror to taper the guided mode into the mirror Bloch mode, thus decreasing losses. The second approach is less intuitive and relies on a recycling mechanism of the radiation losses. The study is supported by computational results obtained for two-dimensional silicon-on-insulator geometries, but the results apply as well to other related geometries like three-dimensional photonic-wire cavities.
  • Keywords
    Q-factor; distributed Bragg reflectors; micro-optics; microcavities; mirrors; optical planar waveguides; optical resonators; photonic crystals; silicon-on-insulator; Bloch-wave engineering; Si; cavity Q; decay rate; defect; desired coupling; detrimental coupling; guided mode; high-Q small-V microcavities; losses; mirror Bloch mode; mode volume; monomode waveguide; optical microcavity; planar fabrication; radiation losses; radiation modes; recycling mechanism; three-dimensional photonic-wire cavities; two Bragg mirrors; two-dimensional silicon-on-insulator geometries; Computational geometry; Microcavities; Mirrors; Optical computing; Optical coupling; Optical device fabrication; Optical losses; Optical waveguides; Recycling; Silicon on insulator technology;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2003.818283
  • Filename
    1242362