DocumentCode :
819049
Title :
The effect of track width and topography on composition uniformity of electroplated Permalloy in thin film heads
Author :
Sahami, Saeed ; Lee, H. P Edward
Author_Institution :
IBM Corp., San Jose, CA, USA
Volume :
28
Issue :
5
fYear :
1992
fDate :
9/1/1992 12:00:00 AM
Firstpage :
2103
Lastpage :
2105
Abstract :
The composition difference of the plated Permalloy in thin-film heads from pole tip to yoke was studied as a function of the track width and topography. The variation of the track width ranged from 5 to 26 μm and that of the topographical height ranged from 0 to 20 μm. Results show that there was no composition difference for flat structures. However, as the topographical height increased from 0 to 20 μm, the composition difference between the yoke and pole tip changed from 0 to 0.5%. In all cases, it was found that higher topographical areas are Fe-rich. This difference was explained by the diffusion mechanism as opposed to a current crowding model. It was concluded that electroplating can be used to deposit Permalloy in track widths as narrow as 5 μm without substantial degradation in composition uniformity
Keywords :
Permalloy; electron probe analysis; electroplated coatings; magnetic heads; magnetic thin film devices; surface topography; EPMA; composition uniformity; diffusion mechanism; electroplated Permalloy; pole tip; thin film heads; topography; track width; yoke; Current density; Degradation; Magnetic heads; Poles and zeros; Proximity effect; Resists; Sputtering; Surfaces; Transistors; Wavelength measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.179410
Filename :
179410
Link To Document :
بازگشت