Title :
Improvements in resolution and dynamic range for FGMOS dosimetry
Author :
McNulty, Peter J. ; Poole, Kelvin F. ; Crisler, Matt ; Reneau, Jason ; Cellere, Giorgio ; Paccagnella, Alessandro ; Stroebel, Dave ; Fennell, Michael ; Perez, Roger ; Randall, Mitchell ; Call, Lynn
Author_Institution :
Dept. of Phys. & Astron., Clemson Univ., SC, USA
Abstract :
The dynamic range and resolution of dosimeters based on floating-gate transistors with electronic readout can be significantly improved by simple changes in the readout process and an increase in the number of memory cells used. The new procedure is illustrated using 8-Mbit UVPROMs from ST Microelectronics.
Keywords :
MOS memory circuits; PROM; dosimetry; radiation hardening (electronics); radiation monitoring; readout electronics; ultraviolet radiation effects; 8-Mbit UVPROMs; FGMOS dosimetry; ST microelectronics; dosimeter resolution; electronic readout; floating-gate transistors; memory cells; Charge measurement; Current measurement; Dosimetry; Dynamic range; Extraterrestrial measurements; Ionizing radiation; Nonvolatile memory; Satellites; Space vehicles; Telemetry;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.860702
