• DocumentCode
    819286
  • Title

    Absolute Charge State Yields of 20 MeV I Ions Scattered from Argon and Xenon

  • Author

    Alton, G.D. ; Biggerstaff, J.A. ; Bridwell, L. ; Jones, C.M. ; Kessel, Q. ; Miller, P.D. ; Moak, C.D. ; Wehring, B.

  • Author_Institution
    Oak Ridge National Laboratory Oak Ridge, Tennessee 37830
  • Volume
    22
  • Issue
    3
  • fYear
    1975
  • fDate
    6/1/1975 12:00:00 AM
  • Firstpage
    1685
  • Lastpage
    1689
  • Abstract
    Absolute yields of charge states resulting from the scattering of 20 MeV Fe and I ions were determined over the range of scattering angles 0° to 1.5°. Measurements were made over the pressure range of 10-3 to 1 Torr as measured in a 2 cm long differentially pumped cell, corresponding to the transition region for nonequilibrium to equilibrium final charge state distributions. The final charge state yields were found to be independent of the initial charge state of the ion species. The relatively large integrated yields make the technique attractive for possible use as a terminal stripper in large tandem accelerators.
  • Keywords
    Argon; Atomic measurements; Charge measurement; Current measurement; Electrons; Ion accelerators; Iron; Particle scattering; Pressure measurement; Xenon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1975.4327967
  • Filename
    4327967