DocumentCode :
819373
Title :
A wide-band comparison of aluminum nitride, alumina, and beryllia microcircuit substrates
Author :
Farzanehfard, Hosein ; He, Jianqing ; Elshabini-Riad, Aicha
Author_Institution :
Virginia Polytechnic Institute of the State University
Volume :
40
Issue :
2
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
490
Lastpage :
492
Keywords :
Aluminum nitride; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency measurement; Thermal conductivity; Thermal expansion; Wideband;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1990.1032993
Filename :
1032993
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=819373
بازگشت