DocumentCode
819373
Title
A wide-band comparison of aluminum nitride, alumina, and beryllia microcircuit substrates
Author
Farzanehfard, Hosein ; He, Jianqing ; Elshabini-Riad, Aicha
Author_Institution
Virginia Polytechnic Institute of the State University
Volume
40
Issue
2
fYear
1991
fDate
4/1/1991 12:00:00 AM
Firstpage
490
Lastpage
492
Keywords
Aluminum nitride; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency measurement; Thermal conductivity; Thermal expansion; Wideband;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1990.1032993
Filename
1032993
Link To Document