• DocumentCode
    819409
  • Title

    The DIALOG chip in the front-end electronics of the LHCb muon detector

  • Author

    Cadeddu, Sandro ; Deplano, Caterina ; Lai, Adriano

  • Author_Institution
    Inst. Nazionale di Fisica Nucl., Cagliari
  • Volume
    52
  • Issue
    6
  • fYear
    2005
  • Firstpage
    2726
  • Lastpage
    2732
  • Abstract
    We present a custom integrated circuit, named DIALOG (DIagnostic, time Adjustment and LOGics), which is a fundamental building block in the front-end architecture of the LHCb Muon detector. DIALOG is realized in IBM 0.25 mum technology, using radiation-hardening layout techniques. DIALOG integrates important tools for detector time alignment procedures and time alignment monitoring on the front-end system. In particular, it integrates 16 programmable delays, which can be regulated in steps of 1 ns. Other features, necessary for the Muon trigger operation and for a safe front-end monitoring are integrated into DIALOG. It generates the information, that will be used by the trigger, as a combination of its 16 inputs from the Amplifier-Shaper-Discriminator (ASD) chips, it generates the thresholds of the ASD, it monitors the rate of all its input channels. We describe the circuit architecture, its internal blocks and its main modes of operation. Measurements performed on final prototypes are also reported
  • Keywords
    application specific integrated circuits; delay lock loops; muon detection; position sensitive particle detectors; radiation hardening (electronics); readout electronics; ASD; DIALOG chip; Diagnostic time Adjustment and LOGics; LHCb muon detector; amplifier-shaper-discriminator chips; application specific integrated circuit; custom integrated circuit; delay locked loop circuits; detector time alignment monitoring; digital-analog conversion; front-end electronics; muon trigger operation; programmable delays; radiation-hardening layout techniques; Application specific integrated circuits; Delay; Detectors; Integrated circuit technology; Logic circuits; Mesons; Monitoring; Performance evaluation; Semiconductor device measurement; Variable speed drives; Application specific integrated circuit; delay locked loop circuits; digital-analog conversion;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2005.862862
  • Filename
    1589270