• DocumentCode
    81964
  • Title

    Radiation Silicon Carbide Detectors Based on Ion Implantation of Boron

  • Author

    Issa, F. ; Vervisch, V. ; Ottaviani, L. ; Szalkai, Dora ; Vermeeren, L. ; Lyoussi, A. ; Kuznetsov, A. ; Lazar, Mircea ; Klix, Axel ; Palais, O. ; Hallen, Anders

  • Author_Institution
    Univ. Aix-Marseille, Marseille, France
  • Volume
    61
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    2105
  • Lastpage
    2111
  • Abstract
    Radiation detectors based on radiation-hardened semiconductor such as silicon carbide (SiC), have received considerable attention in many applications such as in outer space, high energy physics experiments, gas and oil prospection, and nuclear reactors. In the frame work of the European project I_SMART (Innovative Sensor for Material Ageing and Radiation Testing), we demonstrated for the first time the reliability of thermal neutron detectors realized by standard ion implantation of boron atoms to form a neutron converter layer (NCL). Two types of detectors were realized; the first was implanted by aluminum to create the p+-layer, and then implanted by boron (10B) to realize the NCL. The second type was based on epitaxial p+- layer, and was implanted by into the aluminum metallic contact in order to avoid implantation-related defect within the sensitive area. Both kinds of detectors reveal to respond to thermal neutrons and gamma rays, showing consistent counting rates as a function of bias voltages, radiation intensity and type of shielding.
  • Keywords
    boron; high energy physics instrumentation computing; ion implantation; neutron detection; radiation hardening; shielding; silicon compounds; silicon radiation detectors; NCL; SiC; aluminum metallic contact; boron atoms; epitaxial proton+- layer; gamma rays; high energy physics experiments; implantation-related defect; neutron converter layer; radiation intensity; radiation silicon carbide detectors; radiation-hardened semiconductor; shielding; standard ion implantation; thermal neutron detectors; thermal neutrons; Boron; Detectors; Neutrons; Schottky diodes; Silicon carbide; Thyristors; Diode; ion implantation; leakage current; pn junction; silicon carbide; space charge region; thermal neutrons;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2320943
  • Filename
    6849512