DocumentCode :
81964
Title :
Radiation Silicon Carbide Detectors Based on Ion Implantation of Boron
Author :
Issa, F. ; Vervisch, V. ; Ottaviani, L. ; Szalkai, Dora ; Vermeeren, L. ; Lyoussi, A. ; Kuznetsov, A. ; Lazar, Mircea ; Klix, Axel ; Palais, O. ; Hallen, Anders
Author_Institution :
Univ. Aix-Marseille, Marseille, France
Volume :
61
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
2105
Lastpage :
2111
Abstract :
Radiation detectors based on radiation-hardened semiconductor such as silicon carbide (SiC), have received considerable attention in many applications such as in outer space, high energy physics experiments, gas and oil prospection, and nuclear reactors. In the frame work of the European project I_SMART (Innovative Sensor for Material Ageing and Radiation Testing), we demonstrated for the first time the reliability of thermal neutron detectors realized by standard ion implantation of boron atoms to form a neutron converter layer (NCL). Two types of detectors were realized; the first was implanted by aluminum to create the p+-layer, and then implanted by boron (10B) to realize the NCL. The second type was based on epitaxial p+- layer, and was implanted by into the aluminum metallic contact in order to avoid implantation-related defect within the sensitive area. Both kinds of detectors reveal to respond to thermal neutrons and gamma rays, showing consistent counting rates as a function of bias voltages, radiation intensity and type of shielding.
Keywords :
boron; high energy physics instrumentation computing; ion implantation; neutron detection; radiation hardening; shielding; silicon compounds; silicon radiation detectors; NCL; SiC; aluminum metallic contact; boron atoms; epitaxial proton+- layer; gamma rays; high energy physics experiments; implantation-related defect; neutron converter layer; radiation intensity; radiation silicon carbide detectors; radiation-hardened semiconductor; shielding; standard ion implantation; thermal neutron detectors; thermal neutrons; Boron; Detectors; Neutrons; Schottky diodes; Silicon carbide; Thyristors; Diode; ion implantation; leakage current; pn junction; silicon carbide; space charge region; thermal neutrons;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2014.2320943
Filename :
6849512
Link To Document :
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