Title :
Direct measurement of the sensitivity distribution of magnetoresistive heads by the SXM technique
Author :
Sueoka, K. ; Wago, K. ; Sai, F.
Author_Institution :
IBM Tokyo Res. Lab., Japan
fDate :
9/1/1992 12:00:00 AM
Abstract :
The sensitivity distribution of a magnetoresistive (MR) head was obtained by using a scanning probe microscope (SXM) technique. This technique made it possible to map with submicron resolution the sensitivity distribution on the air-bearing surface of the MR head in relation to the head structure. It was observed that the shape and location of the sensitivity distribution varied with changes in the sense current. Comparison with microtrack measurements showed qualitatively good agreements
Keywords :
electric sensing devices; magnetic force microscopy; magnetic heads; magnetoresistive devices; sensitivity; MFM; air-bearing surface; head structure; magnetic forces microscopy; magnetoresistive heads; microtrack measurements; scanning probe microscope; sense current; sensitivity distribution; submicron resolution; Amorphous magnetic materials; Magnetic anisotropy; Magnetic flux; Magnetic force microscopy; Magnetic heads; Magnetic recording; Magnetoresistance; Perpendicular magnetic anisotropy; Saturation magnetization; Shape;
Journal_Title :
Magnetics, IEEE Transactions on
