• DocumentCode
    81995
  • Title

    Effect of Ion Current Density on the Properties of Vacuum Arc-Deposited TiN Coatings

  • Author

    Baranov, Oleg O. ; Jinghua Fang ; Rider, Amanda E. ; Kumar, Sudhakar ; Ostrikov, K.

  • Author_Institution
    Plasma Lab., Nat. Aerosp. Univ. KhAI, Kharkov, Ukraine
  • Volume
    41
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    3640
  • Lastpage
    3644
  • Abstract
    The influence of ion current density on the thickness of coatings deposited in a vacuum arc setup has been investigated to optimize the coating porosity. A planar probe was used to measure the ion current density distribution across plasma flux. A current density from 20 to 50 A/m2 was obtained, depending on the probe position relative to the substrate center. TiN coatings were deposited onto the cutting inserts placed at different locations on the substrate, and SEM was used to characterize the surfaces of the coatings. It was found that low-density coatings were formed at the decreased ion current density. A quantitative dependence of the coating thickness on the ion current density in the range of 20-50 A/m2 were obtained for the films deposited at substrate bias of 200 V and nitrogen pressure 0.1 Pa, and the coating porosity was calculated. The coated cutting inserts were tested by lathe machining of the martensitic stainless steel AISI 431. The results may be useful for controlling ion flux distribution over large industrial-scale substrates.
  • Keywords
    current density; cutting; lathes; porosity; scanning electron microscopy; thin films; titanium compounds; vacuum arcs; vacuum deposited coatings; SEM; TiN; coated cutting; coating porosity; industrial-scale substrates; ion current density; ion current density distribution; ion flux distribution; lathe machining; martensitic stainless steel AISI 431; nitrogen pressure; plasma flux; thin films; vacuum arc-deposited TiN coatings; Australia; Coatings; Current density; Educational institutions; Plasmas; Substrates; Vacuum arcs; DC discharges; ion-assisted deposition; process control; thin films;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2286405
  • Filename
    6656005